金刚石中的8-nm窄带光电探测
ダイヤモンド中の8 nm狭帯域光検出
금강석 중 8-nm 협대역 광전 탐지
Detección fotoeléctrica de banda estrecha de 8 - NM en Diamante
8 - nm bande étroite photodétection dans le diamant
8 - нм узкополосное фотоэлектрическое обнаружение алмазов
Lemin Jia 贾乐敏, Lu Cheng 程璐, Wei Zheng 郑伟
State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials, Sun Yat-sen University, Shenzhen 518107, China
中国 深圳 中山大学材料学院 光电材料与技术国家重点实验室
Spectrally-selective photodetection plays a crucial role in various applications, including target imaging and environmental monitoring. Traditional deep-ultraviolet (DUV) narrowband photodetection systems consist of broadband photodetectors and filters, which complicates the architecture and constrains imaging quality.
Here, we introduce an electronic-grade diamond single-crystal photodetector exhibiting an exceptionally narrow spectral response in the DUV range with a full width at half maximum of 8 nm. By examining diamond photodetectors with varying dislocation densities, we propose that mitigating the defect-induced trapping effect to achieve charge collection narrowing, assisted by free exciton radiative recombination, is an effective strategy for narrowband photodetection.
The superior performance of this device is evidenced through the imaging of DUV light sources, showcasing its capability to differentiate between distinct light sources and monitor human-safe sterilization systems. Our findings underscore the promising potential applications of electronic-grade diamond in narrowband photodetection and offer a valuable technique for identifying electronic-grade diamond.
