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  • Ultrafast multi-target control of tightly focused light fields
  • 2022-01-28
  • Yanxiang Zhang, Xiaofei Liu, Han Lin, Dan Wang, Ensi Cao, Shaoding Liu, Zhongquan Nie, Baohua Jia
  • Opto-Electronic Advances
  • Differences in floral traits and flower visitation rates in mating systems in Prunella vulgaris (Lamiaceae)
  • 2022-02-01
  • Tial C. Ling, Lin-Lin Wang, Yong-Ping Yang, Yuan-Wen Duan
  • Journal of Plant Ecology
  • Pencil-beam scanning catheter for intracoronary optical coherence tomography
  • 2022-03-25
  • Jiqiang Kang, Rui Zhu, Yunxu Sun, Jianan Li, Kenneth K. Y. Wong
  • Opto-Electronic Advances
  • Joint 3D facial shape reconstruction and texture completion from a single image
  • 2021-12-16
  • Xiaoxing Zeng, Zhelun Wu, Xiaojiang Peng, Yu Qiao
  • Computational Visual Media
  • Ultrashort pulsed laser induced complex surface structures generated by tailoring the melt hydrodynamics
  • 2022-03-25
  • Fotis Fraggelakis, George D. Tsibidis, Emmanuel Stratakis
  • Opto-Electronic Advances
  • A universal spray printing strategy to prepare gradient hybrid architectures
  • 2022-03-21
  • Lingyu Du, Songshan Bi, Yang Hu, Rui Wang, Jiacai Zhu, Minghui Zhang, Zhiqiang Niu
  • Carbon Energy
  • Advances in phase-sensitive optical time-domain reflectometry
  • 2022-03-15
  • Shuaiqi Liu, Feihong Yu, Rui Hong, Weijie Xu, Liyang Shao, Feng Wang
  • Opto-Electronic Advances
  • A virus-derived small RNA targets the rice transcription factor ROC1 to induce disease-like symptom
  • 2022-03-17
  • Xiuqin Huang, Feifei Li, Xishan Zhang, Jiahao Chen, Junkai Wang, Jing Wei, Xin Yang, Guohui Zhou, Tong Zhang
  • Phytopathology Research
  • Intelligent metaphotonics empowered by machine learning
  • 2022-03-25
  • Sergey Krasikov, Aaron Tranter, Andrey Bogdanov, Yuri Kivshar
  • Opto-Electronic Advances
  • A combined multiscale modeling and experimental study on surface modification of high-volume micro-nanoparticles with atomic accuracy
  • 2022-03-09
  • Zoushuang Li, Junren Xiang, Xiao Liu, Xiaobo Li, Lijie Li, Bin Shan, Rong Chen
  • International Journal of Extreme Manufacturing
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